Physics and Electro-Optics(15)
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CNT-Based Structure for High-Resolution Semiconductor Process Control (No. T4-1730)
With the continuous trend of electronic component miniaturization, process control technologies must keep up with component size reduction. Defects that were so far negligible, are now posing critical operation obstacles, and are more difficult to identify as scales are reduced to <10 nm. ... Read moreAvishai Benyamini
Physics5602 -
A Novel Technique of Thermoelectric Conversion (No. T4-1583)
The thermoelectric effect is the direct conversion of temperature differences to electric voltage and vice versa. Thermoelectric effects are used in various applications, where heat energy is saved, that would be otherwise lost. ... Read moreYoseph Imry
Physics5536 -
Optical Conversion of Ultra-Fast Laser Pulses (No. T4-1529)
Ultra-fast lasers are highly used in both academia (to monitor chemical & biological reactions) and industry (for submicron resolution products). ... Read moreYaron (deceased) Silberberg
Physics5503 -
Highly Sensitive Nanoscale Scanning Magnetic and Thermal Sensor (No. T4-1481)
A new technology developed by a group of researchers from the Weizmann Institute is a nanoscale sensor-on-tip for local magnetic signals and thermal dissipation with state-of-the-art sensitivity and spatial resolution. ... Read more5482 -
High-Performance Electrochromic Devices (No. T4-1380)
High-performance electrochromic materials that exhibit a practical combination of low-voltage operation and efficient color-switching, as well as long-term stability have been developed by the group of Prof. van der Boom. ... Read more5458 -
Optical Cross-Sectioning Multiphoton Microscopy Without Scanning (No. T4-1266)
Fast cross-sectioning using multiphoton microscope. The conventionally used laser-scanning microscopy, confocal and multiphoton microscopy, although being capable of performing optical sectioning, requires a long image acquisition time, tens of milliseconds per section in current commercial syst ... Read more5446 -
Optical Cross-Sectioning Multiphoton Microscopy Without Scanning (No. T4-1266)
Fast cross-sectioning using multiphoton microscope. The conventionally used laser-scanning microscopy, confocal and multiphoton microscopy, although being capable of performing optical sectioning, requires a long image acquisition time, tens of milliseconds per section in current commercial syst ... Read moreYaron (deceased) Silberberg
Physics5446
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